ZEISS METROTOM
Measure and evaluate entire components with X-Ray-Technology.
With a ZEISS METROTOM computed tomography, you can successfully perform measuring and inspection jobs yourself with only one X-ray scan.
Resolution: 3.5 – 6 μm
Accuracy: Down to 2.9 μm + L/100 Sphere center point error
Industrial Computed Tomography with ZEISS METROTOM
With an industrial computed tomography system from ZEISS, you can successfully perform measuring and inspection jobs yourself with only one X-ray scan.
The standard acceptance test, the precision engineering and the sophisticated calibration process ensure the traceability of the system. Linear guideways and a rotary table meet customers' highest demands for precision.
Perform easy measurements with ZEISS METROTOM
Metrology inspection of a light metal component.
Measuring and inspecting complete components
The ZEISS METROTOM is an industrial computer tomography for measuring and inspecting complete components made of plastic or light metal.
With traditional measuring technology, hidden structures can only be inspected after the time-consuming process of destroying the component layer-by-layer.
Metrology inspection of a light metal component
Measure a lot of characteristics easily and precisely
With ZEISS METROTOM computed tomography system, numerous component characteristics are scanned in one run. The resulting measurements are precise and traceable.
Unlike contact measuring methods, ZEISS METROTOM is significantly faster when capturing numerous measuring points.
Measurement of a base plug
Intuitive handling with easy machine software
Following a short training course on how to use the ZEISS METROTOM OS machine software, the operator is able to tomography components and look into the interior of the component.
With ZEISS CALYPSO you can evaluate the CT data and with ZEISS PiWeb, they can be merged quickly in a single measurement report.
