ZEISS X-ray Tomography Solutions
High Resolution 3D X-ray Microscopy and Computed Tomography Characterize the properties and behaviors of your materials non-destructively. Reveal details of microstructures in three dimensions (3D). Develop and confirm models or visualize structural details. Achieve high contrast and submicron resolution imaging even for relatively large samples.
Xradia Versa
The Xradia Versa family of submicron XRM uses patented X-ray detectors within a microscope objective turret to enable increased magnification on various sample types and sizes, and push spatial resolution down to 500 nm with minimum achievable voxels of <40 nm.
Xradia Ultra
The Xradia Ultra family of nanoscale X-ray microscopes is the only commercially available X-ray microscope that utilizes synchrotron quality X-ray optics and provides true spatial resolution down to <50 nm and minimum achievable voxels of 16nm.
Xradia Context microCT
ZEISS Xradia Context is a large field-of-view, non-destructive 3D X-ray micro-computed tomography system with a robust stage and flexible software-controlled source/detector positioning.
Xradia Crystal CT
Uniquely augments the powerful technique of computed tomography with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials can be studied.
