3D X-ray Microscopy for Faster Sub-Micron Imaging of Intact Samples
The most advanced 3D X-ray microscope models in the ZEISS Xradia Versa family, unlock new degrees of versatility for your scientific and industrial research.
Building on industry-best resolution and contrast, ZEISS Xradia 610 & 620 Versa expand the boundaries of your non-destructive sub-micron scale imaging.
The Xradia Versa family of submicron XRM uses patented X-ray detectors within a microscope objective turret to enable increased magnification on various sample types and sizes and push spatial resolution down to 500 nm with minimum achievable voxels of <40 nm.
Applications:
Electronics and Semiconductor Packaging
Lithium-Ion Batteries
Additive Manufacturing
Materials Research
Raw Materials
